发明名称 Method and system for controlling chemical mechanical polishing by controllably moving a slurry outlet
摘要 A system and a method of operating a chemical mechanical polishing (CMP) system comprises a slurry delivering unit configured for locally varying the supply of slurry while polishing the substrate. To this end, the slurry delivering unit may comprise at least one slurry outlet over a polishing pad of the CMP system, wherein the at least one slurry outlet is controllably movable to distribute slurry over the polishing pad.
申请公布号 US8622783(B2) 申请公布日期 2014.01.07
申请号 US201113157447 申请日期 2011.06.10
申请人 KIESEL AXEL;STOECKGEN UWE;LAMPETT JOHN;WUNDRAM HEIKO;ADVANCED MICRO DEVICES, INC. 发明人 KIESEL AXEL;STOECKGEN UWE;LAMPETT JOHN;WUNDRAM HEIKO
分类号 B24B1/00;B24B37/04;B24B49/00;B24B51/00 主分类号 B24B1/00
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