发明名称 Method and device for treating silicon wafers
摘要 A method and device for treating silicon wafers. In a first step, the silicon wafers (22) are conveyed flat along a continuous, horizontal conveyor belt (12, 32) and nozzles (20) or the like spray an etching solution (21) from the top onto the wafers to texture them, only little etching solution (21) being applied to the silicon wafers (22) from below. In a second step, the silicon wafers (22), which are aligned as in the first step, are wetted exclusively from below with the etching solution (35) to etch-polish them.
申请公布号 US8623232(B2) 申请公布日期 2014.01.07
申请号 US20100818853 申请日期 2010.06.18
申请人 KAPPLER HEINZ;GEBR. SCHMID GMBH & CO. 发明人 KAPPLER HEINZ
分类号 C03C15/00;C03C25/68 主分类号 C03C15/00
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