发明名称 Method for making photomask layout
摘要 A method for making a photomask layout is provided. A first graphic data of a photomask is provided, wherein the first graphic data includes a first line with a first line end target, a second line with a second line end target and a hole, the first line is aligned with the second line, and the first line, the second line and the hole partially overlap with each other. Thereafter, a retarget step is performed to the first graphic data to obtain a second graphic data, wherein the retarget step includes moving the first line end target and the second line end target in opposite directions away from each other.
申请公布号 US8627242(B1) 申请公布日期 2014.01.07
申请号 US201313754257 申请日期 2013.01.30
申请人 UNITED MICROELECTRONICS CORP. 发明人 KUO HUI-FANG;CHEN MING-JUI;WANG CHENG-TE
分类号 G06F17/50 主分类号 G06F17/50
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