Method and system for testing and calibrating an accelerometer of an electronic device

摘要

A method and system for testing and calibrating an accelerometer of an electronic device are provided. In accordance with one embodiment, there is a method of testing and calibrating an accelerometer of an electronic device, comprising: detecting the electronic device within a nest of a test fixture; calculating an offset value for each sensing axis of the accelerometer in response to detecting the electronic device within the nest; and storing the offset values in a memory of the electronic device.