发明名称 Method and apparatus for reducing read disturb in memory
摘要 Various aspects of a NAND memory include a control circuit that applies a read bias arrangement to a plurality of word lines to read a selected data value stored on a plurality of memory cells by measuring current flowing between the first end and the second end of the series of memory cells. The read bias arrangement is applied to word lines of the plurality of word lines applies only word line voltages less than a second maximum of a second threshold voltage distribution.
申请公布号 US8625343(B2) 申请公布日期 2014.01.07
申请号 US20100878299 申请日期 2010.09.09
申请人 HUNG CHUNG-HSIUNG;HUNG SHUO-NAN;LIU TSENG-YI;MACRONIX INTERNATIONAL CO., LTD. 发明人 HUNG CHUNG-HSIUNG;HUNG SHUO-NAN;LIU TSENG-YI
分类号 G11C11/34;G11C16/04 主分类号 G11C11/34
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