| 摘要 |
PROBLEM TO BE SOLVED: To provide a system and a method for remotely monitoring and developing steps in a manufacturing process of a semiconductor. SOLUTION: The remote test system of a semiconductor is provided with at least one remote work station which is connected to a local workstation through a remote access link, and a test system which is connected to the local workstation through the link. The system can remotely operate and monitor the test system of the semiconductor, and can receive data from a distance from the test system of the semiconductor. Also, the system prevents either of the remote workstations from accessing the other remote workstations by its characteristic from a security standpoint.
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