| 摘要 |
Provided are various multi-lane ADCs in which each of digital output samples accurately shows each of analog inputs by nearly compensating combinations existing within various signals originating from various defects such as phase offset, amplitude offset, and/or DC offset. In general, various multi-lane ADCs decide various statistical relationships such as various correlations between various signals and various known correction signals for quantizing phase offset, amplitude offset, and/or DC offset capable of existing within various signals. The various multi-lane ADCs controls various signals for nearly compensating phase offset, amplitude offset, and/or DC offset based on these various statistical relationships, so that the each of digital output samples accurately shows the each of analog inputs. [Reference numerals] (404) Defect detection module; (406.1,406.2,406.i) Phase control module; (458.1,458.2,458.i) Gain/offset control module |
