发明名称 |
METHOD FOR PRODUCING SEMICONDUCTOR DEVICE |
摘要 |
This method for producing a semiconductor device (100) has the following steps: preparing a semiconductor substrate (16) having a first principal surface (16A) and a second principal surface (16B) which face one another; affixing the semiconductor substrate (16) with adhesive tape (1) on the first principal surface (16A); positioning the semiconductor substrate (16) affixed by the adhesive tape (1) inside a housing chamber (31); emitting exhaust from the housing chamber (31) while maintaining an adhesive-tape (1) temperature of 100°C or higher; reducing the temperature of the semiconductor substrate (16) following the step for emitting exhaust from the housing chamber (31); and forming an electrode (15) on the second principal surface (16B) of the semiconductor substrate (16) following the step for reducing the temperature of the semiconductor substrate (16). As a result, it is possible to provide a method for producing a semiconductor device capable of reducing the contact resistance between a semiconductor substrate and an electrode. |
申请公布号 |
WO2014002603(A1) |
申请公布日期 |
2014.01.03 |
申请号 |
WO2013JP62215 |
申请日期 |
2013.04.25 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
KITABAYASHI, HIROYUKI |
分类号 |
H01L21/02;H01L21/28;H01L21/336;H01L29/12;H01L29/78 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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