发明名称 FABRICATION OF WINDOW CAVITY CAP STRUCTURES IN WAFER LEVEL PACKAGING
摘要 A method of forming a window cap wafer (WCW) structure for semiconductor devices includes machining a plurality of cavities into a front side of a first substrate; bonding the first substrate to a second substrate, at the front side of the first substrate; removing a back side of the first substrate so as to expose the plurality of cavities, thereby defining the WCW structure comprising the second substrate and a plurality of vertical supports comprised of material of the first substrate.
申请公布号 WO2014004162(A1) 申请公布日期 2014.01.03
申请号 WO2013US46283 申请日期 2013.06.18
申请人 RAYTHEON COMPANY 发明人 DIEP, BUU;BLACK, STEPHEN H.
分类号 H01L21/56 主分类号 H01L21/56
代理机构 代理人
主权项
地址