发明名称 ARITHMETIC LOGIC UNIT TESTING SYSTEM AND METHOD
摘要 A testing system and method for an arithmetic logic unit are provided. The system includes: a control unit, a data providing unit, a first input unit, a second input unit, an arithmetic logic unit, an expected result unit, a comparator and a test result storage unit. The control unit controls the testing process. The data providing unit provides data for the first input unit, the second input unit and the expected result unit. The first input unit and the second input unit provide test data for the arithmetic logic unit. The arithmetic logic unit performs an operation and provides an operation result for the comparator. The expected result unit generates an expected result and provides the expected result of this round of testing for the comparator. The comparator compares the operation result with the expected result, and provides a comparison result for the test result storage unit.
申请公布号 WO2014000693(A1) 申请公布日期 2014.01.03
申请号 WO2013CN78402 申请日期 2013.06.28
申请人 SHANGHAI XINHAO MICROELECTRONICS CO. LTD. 发明人 LIN, KENNETH CHENGHAO
分类号 G01R31/3177 主分类号 G01R31/3177
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