| 摘要 |
An impedance measurement method is provided having a certain level of measurement sensitivity across all ranges of impedance and capable of covering a wide measurement range. In the method, a device under test (DUT) is connected in series or in parallel to a signal line, a measurement signal is transmitted from a signal source, an input signal a1 into the DUT, a reflected signal reflected from the DUT, and a passed signal that passed through the DUT are measured, S-parameters S11 and S21 are calculated based on respective measured values of the input signal, the reflected signal, and the passed signal, and an impedance Zx of the DUT is calculated based on a formula: Zx=2Z0S11/S21, where Z0 is a characteristic impedance. |
