发明名称 METHOD FOR PROCESSING SILICON WAFER
摘要 A method for processing a silicon wafer is provided, the method including allowing an etchant to flow along a surface of the silicon wafer to form a line in which a plurality of apertures are arranged in a flow direction of the etchant from an upstream side to a downstream side, wherein the apertures arranged in the line includes a first aperture formed on the most upstream side and a second aperture formed downstream of the first aperture in the flow direction of the etchant, and wherein the first aperture and the second aperture are subjected to different processes after being formed.
申请公布号 US2014004629(A1) 申请公布日期 2014.01.02
申请号 US201313925364 申请日期 2013.06.24
申请人 CANON KABUSHIKI KAISHA 发明人 FUJITA HIROHISA;KOYAMA SHUJI;MATSUMOTO KEIJI;FURUSAWA KENTA
分类号 H01L21/306 主分类号 H01L21/306
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