发明名称 On-Chip Probe Circuit for Detecting Faults in an FPGA
摘要 An integrated programmable logic circuit having a read/write probe includes a plurality of programmable logic circuits having internal circuit nodes and a plurality of flip flops, each having an asynchronous data input line, an asynchronous load line, and a data output connected to an internal circuit node, a probe-data line, an address circuit for selecting one of the internal circuit nodes, a read-probe enable line for selectively coupling the selected one of the internal circuit nodes to the probe-data line, a data input path to the asynchronous data input line of each flip flop, a write-probe data input path to the asynchronous data input line of each flip flop, a write-probe enable line, and selection circuitry, responsive to the address circuit and the write-probe enable line, to couple one of the data input path and the write-probe data input path to the asynchronous data input of a selected flip flop.
申请公布号 US2014006887(A1) 申请公布日期 2014.01.02
申请号 US201313933353 申请日期 2013.07.02
申请人 MICROSEMI SOC CORPORATION 发明人 GREENE JONATHAN W.;KANNEMACHER DIRK;HECHT VOLKER;SPEERS THEODORE
分类号 G01R31/3177 主分类号 G01R31/3177
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