发明名称 SWITCH APPARATUS AND TEST APPARATUS
摘要 There is provided a semiconductor switch apparatus that can handle a wide range of input voltages. The switch apparatus includes a main switch that is provided between a first terminal and a second terminal, and a switch controller that, to turn on the main switch, supplies the same gate-source voltage to the main switch irrespective of a direction of a current flowing through the main switch. To turn on the main switch, the switch controller supplies the gate-source voltage that is determined based on at least one of a voltage of the first terminal and a voltage of the second terminal to a gate of the main switch.
申请公布号 US2014002105(A1) 申请公布日期 2014.01.02
申请号 US201313866032 申请日期 2013.04.19
申请人 ADVANTEST CORPORATION 发明人 HATA YOSHIYUKI;NAKANISHI MAKOTO;TAKIKAWA MASAHIKO
分类号 H03K17/10;G01R1/30 主分类号 H03K17/10
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