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发明名称
触控面板及触碰点的侦测方法
摘要
申请公布号
TWI421755
申请公布日期
2014.01.01
申请号
TW098132452
申请日期
2009.09.25
申请人
联阳半导体股份有限公司 新竹市新竹科学工业园区创新一路13号3楼
发明人
吴仓志
分类号
G06F3/044
主分类号
G06F3/044
代理机构
代理人
詹铭文 台北市中正区罗斯福路2段100号7楼之1;萧锡清 台北市中正区罗斯福路2段100号7楼之1
主权项
地址
新竹市新竹科学工业园区创新一路13号3楼
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