发明名称 DRIVER CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE FOR DECREASING LEAKAGE CURRENT
摘要 A driver circuit of a semiconductor memory device for decreasing a leakage current is provided to reduce the intensity of a GIDL current in a standby mode, by decreasing the level of a voltage supplied in the standby mode to be lower than the level of a voltage supplied in an active mode. According to a driver circuit of a semiconductor memory device, a first driver circuit generates a first driving signal based on a first row address signal in response to a mode control signal. A second driver circuit includes a first transistor having a first port receiving the first driving signal and a second port, and generates a second driving signal on the basis of the first driving signal and a second row address signal. The first driver circuit drives the first driving signal with a first power supply voltage or a second power supply voltage in a first mode, and drives the first driving signal with a third power supply voltage in a second mode. The third power supply voltage is lower than the first power supply voltage and is higher than the second power supply voltage.
申请公布号 KR100801059(B1) 申请公布日期 2008.02.04
申请号 KR20060073103 申请日期 2006.08.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, JONG HYUN;LEE, KYU CHAN;YIM, SUNG MIN;SHIN, DONG HAK
分类号 G11C5/14 主分类号 G11C5/14
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