发明名称 SEMICONDUCTOR MEMORY HAVING RESISTANCE CHANGE ELEMENT
摘要 <p><P>PROBLEM TO BE SOLVED: To facilitate a manufacturing process by reducing the number of write lines. <P>SOLUTION: A semiconductor memory includes: word lines WL extending in a first direction; first, second and third bit lines BL1, BL2, BL3 extending in a second direction; a first cell unit Cu1 connected between the first and second bit lines BL1, BL2; a second cell unit Cu2 connected between the first and third bit lines BL1, BL3; and a controller CNT which makes the word lines WL active and executes write to a first resistance change element R1 in such a state that potentials of the first and third bit lines BL1, BL3 are made equal to each other, and which makes the word lines WL active and executes write to a second resistance change element R2 in such a state that potentials of the first and second bit lines BL1, BL2 are made equal to each other. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008047220(A) 申请公布日期 2008.02.28
申请号 JP20060222005 申请日期 2006.08.16
申请人 TOSHIBA CORP 发明人 UEDA YOSHIHIRO
分类号 G11C11/15;H01L21/8246;H01L27/105;H01L43/08 主分类号 G11C11/15
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