发明名称 Cleaning composition, method for producing semiconductor device, and cleaning method
摘要 Provided are a cleaning composition which is capable of inhibiting the metal of a semiconductor substrate from corrosion, and has an excellent removability of plasma etching residues and/or ashing residues on the semiconductor substrate, a method for producing a semiconductor device, and a cleaning method using the cleaning composition. The cleaning composition for removing plasma etching residues and/or ashing residues formed on a semiconductor substrate, and a preparation method and a cleaning method for a semiconductor device, using the cleaning composition, wherein the cleaning composition includes (Component a) water; (Component b) an amine compound; (Component c) hydroxylamine and/or a salt thereof; (Component d) a quaternary ammonium compound; (Component e) an organic acid; and (Component f) a water-soluble organic solvent; and has a pH of 6 to 9.
申请公布号 US8617417(B2) 申请公布日期 2013.12.31
申请号 US201113107199 申请日期 2011.05.13
申请人 INABA TADASHI;TAKAHASHI KAZUTAKA;TAKAHASHI TOMONORI;MIZUTANI ATSUSHI;FUJIFILM CORPORATION 发明人 INABA TADASHI;TAKAHASHI KAZUTAKA;TAKAHASHI TOMONORI;MIZUTANI ATSUSHI
分类号 C09K13/00 主分类号 C09K13/00
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