发明名称 Method and structure for forming high-K/metal gate extremely thin semiconductor on insulator device
摘要 A semiconductor device is provided that includes a gate structure present on a substrate. The gate structure includes a gate conductor with an undercut region in sidewalls of a first portion of the gate conductor, wherein a second portion of the gate conductor is present over the first portion of the gate conductor and includes a protruding portion over the undercut region. A spacer is adjacent to sidewalls of the gate structure, wherein the spacer includes an extending portion filling the undercut region. A raised source region and a raised drain region is present adjacent to the spacers. The raised source region and the raised drain region are separated from the gate conductor by the extending portion of the spacers.
申请公布号 US8617956(B2) 申请公布日期 2013.12.31
申请号 US20100859414 申请日期 2010.08.19
申请人 DORIS BRUCE B.;CHENG KANGGUO;KHAKIFIROOZ ALI;KULKARNI PRANITA;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DORIS BRUCE B.;CHENG KANGGUO;KHAKIFIROOZ ALI;KULKARNI PRANITA
分类号 H01L29/78;H01L21/36 主分类号 H01L29/78
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