发明名称 Methods of forming bonded semiconductor structures in 3D integration processes using recoverable substrates, and bonded semiconductor structures formed by such methods
摘要 Methods of forming bonded semiconductor structures include forming through wafer interconnects through a layer of material of a first substrate structure, bonding one or more semiconductor structures over the layer of material, and electrically coupling the semiconductor structures with the through wafer interconnects. A second substrate structure may be bonded over the processed semiconductor structures on a side thereof opposite the first substrate structure. A portion of the first substrate structure then may be removed, leaving the layer of material with the through wafer interconnects therein attached to the processed semiconductor structures. At least one through wafer interconnects then may be electrically coupled to a conductive feature of another structure, after which the second substrate structure may be removed. Bonded semiconductor structures are formed using such methods.
申请公布号 US8617925(B2) 申请公布日期 2013.12.31
申请号 US201113206280 申请日期 2011.08.09
申请人 SADAKA MARIAM;NGUYEN BICH-YEN;SOITEC 发明人 SADAKA MARIAM;NGUYEN BICH-YEN
分类号 H01L23/538;H01L21/58;H01L21/768 主分类号 H01L23/538
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