发明名称 METHOD FOR MANUFACTURING DISPLAY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing, with high productivity, a display device excelling in electric characteristics, and having a thin-film transistor with high reliability. SOLUTION: A gate insulating film is formed over a gate electrode; a microcrystalline semiconductor film is formed over the gate insulating film; the microcrystalline semiconductor film is irradiated with a laser beam from the surface thereof, whereby the crystallinity of the microcrystalline semiconductor film is improved. Then, a thin-film transistor is formed using the microcrystalline semiconductor film whose crystallinity is improved. Further, a display device including the thin-film transistor is manufactured. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009049388(A) 申请公布日期 2009.03.05
申请号 JP20080185728 申请日期 2008.07.17
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MIYAIRI HIDEKAZU;JINBO YASUHIRO;NEI TAKAMASA
分类号 H01L29/786;G02F1/1368;G09F9/30;H01L21/20;H01L21/268;H01L21/28;H01L21/3205;H01L21/336;H01L23/52;H01L27/32;H01L29/417;H01L51/50 主分类号 H01L29/786
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