SEMICONDUCTOR DEVICE HAVING A POWER METAL-OXIDE-SILICON TRANSISTOR
摘要
<p>The present invention provides a semiconductor device having a power MOS transistor capable of minimizing the calorific value and improving the reliability. The semiconductor device having a power MOS transistor according to the present invention comprises a semiconductor substrate in which an impurity region having a first conductivity is formed; a drift region which is formed in the impurity region and has the first conductivity; a body region which is formed in the impurity region to be adjacent to the drift region and has a second conductivity different from the first conductivity; a drain extension insulating film which is formed on the drift region; a gate insulating film and a gate electrode which are sequentially laminated on the semiconductor substrate to straddle a part of the body region and a part of the drift region; a drain extension electrode which is formed on the drain extension insulating film; a drain region which is adjacent to one side opposite to the body region in the drift region and has the first conductivity; and a second source which is formed in the body region and has the second conductivity.</p>
申请公布号
KR20130142789(A)
申请公布日期
2013.12.30
申请号
KR20120066315
申请日期
2012.06.20
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
JANG JAE JUNE;KIM, MIN HWAN;JANG, DONG EUN;CHANG, HOON