发明名称 |
APPARATUS AND METHOD FOR ANALYZING GRAPHENE |
摘要 |
<p>Disclosed are a method for analyzing graphene and an analysis equipment. The method of the present invention comprises: a step of preparing a supporting part and a first graphene structure including graphene with grain and a grain boundary in at least one side of the supporting part; a step of forming a second graphene structure by oxidation-processing the first graphene structure; and a step of detecting the shape of the graphene. . [Reference numerals] (AA,CC) Start;(BB) Oxidizing step;(S110) Preparing a first graphene structure;(S131) Supplying H_2 O;(S132) Radiating UV;(S133) Removing H_2 O from the surface of the graphene structure;(S150) Detecting the shape of graphene</p> |
申请公布号 |
KR20130142794(A) |
申请公布日期 |
2013.12.30 |
申请号 |
KR20120066320 |
申请日期 |
2012.06.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY |
发明人 |
LEE, YOUNG HEE;HAN, GANG HEE;DUONG DINH LOC |
分类号 |
G01N33/00;C01B31/02;G01N21/33 |
主分类号 |
G01N33/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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