GLASS INSPECTION DEVICE AND INSPECTION METHOD THEREOF

摘要

The present invention relates to a device and a method for inspecting a glass substrate and, more specifically, a device and a method for inspecting a glass substrate which perform a second high resolution inspection for a defective point detected during a first inspection after the first inspection, thereby improving the performance and reliability of inspection and reducing inspection costs. The glass substrate inspection device according to the present invention comprises: a fixed unit installed in a working space; a first photographing unit which is installed at the upper or lower part of the front end of the fixed unit which receives a glass substrate and taking a first image of the glass substrate; a second photographing unit which is installed at the upper or lower part of the rear end of the fixed unit which discharges the glass substrate and taking a second image of the transferred glass substrate; and a glass substrate inspection device for receiving the images photographed by the first and second photographing units and inspecting the surface state of the glass substrate.