发明名称 METHOD OF MANUFACTURING EPITAXIAL SILICON WAFER AND EPITAXIAL SILICON WAFER MANUFACTURED BY THE METHOD
摘要 <p>In a method for manufacturing an epitaxial silicon wafer with an epitaxial layer formed on the surface of a phosphorus-added silicon wafer based on the in-plane resistance distribution of the silicon wafer before an epitaxial growth process, the in-plane thickness distribution of the epitaxial layer formed on the surface is controlled. [Reference numerals] (AA) Epitaxial layer thickness [μm];(BB) Distance from the center of an epitaxial silicon wafer [mm]</p>
申请公布号 KR20130142082(A) 申请公布日期 2013.12.27
申请号 KR20130068890 申请日期 2013.06.17
申请人 SUMCO TECHXIV CORPORATION 发明人 KAWASHIMA TADASHI;NONAKA NAOYA
分类号 H01L21/20 主分类号 H01L21/20
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