发明名称 |
METHOD OF MANUFACTURING EPITAXIAL SILICON WAFER AND EPITAXIAL SILICON WAFER MANUFACTURED BY THE METHOD |
摘要 |
<p>In a method for manufacturing an epitaxial silicon wafer with an epitaxial layer formed on the surface of a phosphorus-added silicon wafer based on the in-plane resistance distribution of the silicon wafer before an epitaxial growth process, the in-plane thickness distribution of the epitaxial layer formed on the surface is controlled. [Reference numerals] (AA) Epitaxial layer thickness [μm];(BB) Distance from the center of an epitaxial silicon wafer [mm]</p> |
申请公布号 |
KR20130142082(A) |
申请公布日期 |
2013.12.27 |
申请号 |
KR20130068890 |
申请日期 |
2013.06.17 |
申请人 |
SUMCO TECHXIV CORPORATION |
发明人 |
KAWASHIMA TADASHI;NONAKA NAOYA |
分类号 |
H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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