SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要
<p>A semiconductor device and a manufacturing method thereof. The method comprises: forming a first masking layer (106) on a substrate (100); forming one of a source region and a drain region (118) with stress by using the first masking layer as a mask; forming a second masking layer (120) on the substrate; forming the other one of the source region and the drain region by using the second masking layer as a mask; removing a part of the second masking layer, the part being close to the other one of the source region and the drain region; forming a gate dielectric layer (130), and forming a gate conductor (134) in the form of a side wall on a side wall of the remaining part of the second masking layer.</p>
申请公布号
WO2013189096(A1)
申请公布日期
2013.12.27
申请号
WO2012CN77852
申请日期
2012.06.29
申请人
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;ZHU, HUILONG;LIANG, QINGQING;ZHONG, HUICAI