NANO-THERMOELECTRIC SEEBECK COEFFICIENT IN-SITU QUANTITATIVE CHARACTERIZATION DEVICE BASED ON ATOMIC FORCE MICROSCOPE

摘要

A nano-thermoelectric material micro-area Seebeck coefficient in-situ quantitative characterization device based on an atomic force microscope comprises: an atomic force microscope in-situ excitation platform for harmonic signals (11), used to simultaneously perform in-situ excitation to obtain frequency-doubled and frequency-tripled harmonic signals of a nano-thermoelectric material micro-area, and specifically comprises a Wheatstone bridge consisting of a thermoelectric detection probe (12), a thermoelectric reference probe (13), two adjustable resistor networks (14, 15) and a signal generator (16); a nano-thermoelectric Seebeck coefficient in-situ detection platform (2), used to implement real-time in-situ detection and processing on the frequency-doubled and frequency-tripled signals of the nano-thermoelectric material micro-area, calculate the micro-area Seebeck coefficient according to the frequency-doubled and frequency-tripled signals, and display a result. A new method for characterizing a nano Seebeck coefficient based on a harmonic effect induced by a commercial atomic force microscope thermal probe is established through combining the nano detection function of an atomic force microscope, a frequency-tripled testing principle of macroscopic thermal conductivity, a Joule thermal effect principle, and a macroscopic Seebeck coefficient testing principle.