发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE HAVING A LAMINATED STRUCTURE COMPRISING A BORON-DOPED SILICON GERMANIUM FILM AND A METAL FILM
摘要 A semiconductor device has memory cell portions and compensation capacitance portions on a single substrate. The memory cell portion and the compensation capacitance portion have mutually different planar surface areas. The memory cell portion and the compensation capacitance portion include capacitance plate electrodes of the same structure. The capacitance plate electrode has a laminated structure including a boron-doped silicon germanium film and a metal film.
申请公布号 US2013344674(A1) 申请公布日期 2013.12.26
申请号 US201313974553 申请日期 2013.08.23
申请人 SAKO NOBUYUKI;ELPIDA MEMORY, INC. 发明人 SAKO NOBUYUKI
分类号 H01L49/02 主分类号 H01L49/02
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