发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To solve such a problem that in a transistor, variation in a property such as a threshold and mobility is caused by piling of primary factors of variation of gate length, gate width, and film thickness of a gate insulation film caused by production process or the like; consequently, variation is caused in a current value supplied from a circuit by influence of variation of a property of a transistor.SOLUTION: A signal line is connected electrically to first to third circuits having transistors being adjacent to each other through a switching circuit, but it is not connected electrically to forth and fifth circuits being adjacent. By this constitution, such a semiconductor device can be provided that influence of a property of a transistor is suppressed and variation is not caused in current values.
申请公布号 JP2013257575(A) 申请公布日期 2013.12.26
申请号 JP20130150057 申请日期 2013.07.19
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 KIMURA HAJIME;KOYAMA JUN
分类号 G09G3/30;G09G3/20;H01L51/50 主分类号 G09G3/30
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