发明名称 Method of Making a Microelectronic Interconnect Element With Decreased Conductor Spacing
摘要 A microelectronic interconnect element can include a plurality of first metal lines and a plurality of second metal lines interleaved with the first metal lines. Each of the first and second metal lines has a surface extending within the same reference plane. The first metal lines have surfaces above the reference plane and remote therefrom and the second metal lines have surfaces below the reference plane and remote therefrom. A dielectric layer can separate a metal line of the first metal lines from an adjacent metal line of the second metal lines.
申请公布号 US2013341299(A1) 申请公布日期 2013.12.26
申请号 US201313914616 申请日期 2013.06.10
申请人 TESSERA, INC. 发明人 RYU CHANG MYUNG;ENDO KIMITAKA;HABA BELGACEM;KUBOTA YOICHI
分类号 B81C1/00;C25D7/00 主分类号 B81C1/00
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