| 摘要 |
PROBLEM TO BE SOLVED: To suppress difference between beams in a multi-beam semiconductor laser device.SOLUTION: Auxiliary electrode patterns 13Sa and 13Sc are provided on a surface of a sub-mount 10 located in an optical path of backward light emitted from a laser chip 11. Accordingly, the respective backward light emitted from a plurality of light emission sections of the laser chip 11 are incident on a photodiode chip 14 independently from a surface condition of the sub-mount 10, thereby variation of a current value caused by the surface condition of the sub-mount 10 is suppressed, and the current value can be monitored with high accuracy. |
