发明名称 |
PARTICLE MEASURING APPARATUS AND PARTICLE MEASURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a particle measuring apparatus and a particle measuring method capable of detecting/reducing measurement impedance value fluctuation due to a circuit drift and achieving highly accurate impedance change measurement.SOLUTION: The particle measuring apparatus includes: at least a pair of electrodes 11 immersed inside a cell for introducing particle-containing liquid; a migration power supply part 4 for applying an AC voltage to the electrodes 11 and making dielectrophoretic force act on particles; a measurement part 5 for measuring impedance between the electrodes 11; and a control operation part 6 for calculating the number of particles inside the liquid from the measurement result of the measurement part 5 and measuring the conductance of the liquid. The control operation part 6 refers to a table or a function indicating an electrode impedance fluctuation value for each conductance, and corrects a calculation result on the basis of an electrode impedance fluctuation value according to the measurement result of the conductance. |
申请公布号 |
JP2013257348(A) |
申请公布日期 |
2013.12.26 |
申请号 |
JP20130206445 |
申请日期 |
2013.10.01 |
申请人 |
PANASONIC CORP |
发明人 |
HAMADA SATORU;TANAKA TOSHIYUKI;INAGUCHI TETSUYA |
分类号 |
G01N27/02;G01N27/00;G01N27/06 |
主分类号 |
G01N27/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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