发明名称 PARTICLE MEASURING APPARATUS AND PARTICLE MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a particle measuring apparatus and a particle measuring method capable of detecting/reducing measurement impedance value fluctuation due to a circuit drift and achieving highly accurate impedance change measurement.SOLUTION: The particle measuring apparatus includes: at least a pair of electrodes 11 immersed inside a cell for introducing particle-containing liquid; a migration power supply part 4 for applying an AC voltage to the electrodes 11 and making dielectrophoretic force act on particles; a measurement part 5 for measuring impedance between the electrodes 11; and a control operation part 6 for calculating the number of particles inside the liquid from the measurement result of the measurement part 5 and measuring the conductance of the liquid. The control operation part 6 refers to a table or a function indicating an electrode impedance fluctuation value for each conductance, and corrects a calculation result on the basis of an electrode impedance fluctuation value according to the measurement result of the conductance.
申请公布号 JP2013257348(A) 申请公布日期 2013.12.26
申请号 JP20130206445 申请日期 2013.10.01
申请人 PANASONIC CORP 发明人 HAMADA SATORU;TANAKA TOSHIYUKI;INAGUCHI TETSUYA
分类号 G01N27/02;G01N27/00;G01N27/06 主分类号 G01N27/02
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