发明名称 Reflection Shadow Mask Alignment Using Coded Apertures
摘要 In a shadow mask-substrate alignment method, a light source, a beam splitter, a first substrate including a first grate, a second substrate including a second grate, and a light receiver are positioned relative to each other to define a light path that includes light output by the light source being reflected a first time by the beam splitter. The light reflected the first time passes through the first or second grate and is at least partially reflected a second time by the second or first grate back through the first or the second grate, respectively. The light reflected the second time passes at least partially through the beam splitter for receipt by the light receiver. The orientation of the first substrate, the second substrate or both is adjusted to position the first grate, the second grate, or both until a predetermined amount is received by the light receiver.
申请公布号 US2013342843(A1) 申请公布日期 2013.12.26
申请号 US201313973328 申请日期 2013.08.22
申请人 ADVANTECH GLOBAL, LTD 发明人 TAMURA NOBUHIKO
分类号 G03F9/00 主分类号 G03F9/00
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