发明名称 Camera-Assisted Two Dimensional Keystone Correction
摘要 A system and method for facilitating keystone correction in a given model of projector having an attached camera is disclosed. System calibration determines intrinsic and extrinsic parameters of the projector and camera; then control points are identified within a three-dimensional space in front of a screen. The three-dimensional space defines a throw range and maximum pitch and yaw offsets for the projector/screen combination. At each control point, the projector projects a group of structured light elements on the screen and the camera captures an image of the projected pattern. These images are used to create three-dimensional look-up tables that identify a relationship between each image and at least one of (i) pitch and yaw offset angles for the respective control point and (ii) a focal length and a principal point for the respective control point. The given model projectors use the tables in effectuating keystone correction.
申请公布号 US2016173842(A1) 申请公布日期 2016.06.16
申请号 US201514967035 申请日期 2015.12.11
申请人 Texas Instruments Incorporated 发明人 De La Cruz Jaime Rene;Kempf Jeffrey Mathew;Nadaf Ramzansaheb
分类号 H04N9/31 主分类号 H04N9/31
代理机构 代理人
主权项 1. A method for effecting keystone correction on a projector, the method comprising: using a given model of projector that has a camera attached thereto in a known relationship to project a group of structured light elements on a screen; capturing the projected group of structured light elements using the camera; using the received image and a plurality of three-dimensional look-up tables (LUTs) stored on the given model of projector to determine the effective focal length and principal point of the given model of projector; and determining a pitch offset angle and a yaw offset angle between the given model of projector and the screen to effectuate keystone correction.
地址 Dallas TX US