| 摘要 |
PROBLEM TO BE SOLVED: To detect a defect with high accuracy without having a plurality of light sources and means for controlling the light sources in a defect inspection device for detecting a defect such as a flaw or scratch on the surface of a sheet product.SOLUTION: Provided is an image processing device equipped with image processing means and defect detection means for detecting a defect on the basis of an image to which image processing has been applied, wherein the image processing means includes address arithmetic means for calculating an address for accessing pixel data stored for image processing, pixel data access means for reading or writing the pixel data of image storage means on the basis of the calculated address, pixel data storage means for temporarily storing read or written pixel data, and pixel data arithmetic processing means for rewriting temporarily stored pixel data with the calculation result of the pixel data by image processing, the image processing being performed on the pixel data of peripheral pixels separate by a prescribed number of pixels in accordance with the sizes of a pixel of interest that is the object of image processing and a defect assumed from the pixel of interest.SELECTED DRAWING: Figure 2 |
