发明名称 Semiconductor Device with Selectively Etched Surface Passivation
摘要 A semiconductor device includes a semiconductor substrate configured to include a channel, a gate supported by the semiconductor substrate to control current flow through the channel, a first dielectric layer supported by the semiconductor substrate and including an opening in which the gate is disposed, and a second dielectric layer disposed between the first dielectric layer and a surface of the semiconductor substrate in a first area over the channel. The second dielectric layer is patterned such that the first dielectric layer is disposed on the surface of the semiconductor substrate in a second area over the channel.
申请公布号 US2013341678(A1) 申请公布日期 2013.12.26
申请号 US201213533610 申请日期 2012.06.26
申请人 GREEN BRUCE M.;HILL DARRELL G.;HUANG JENN HWA;MOORE KAREN E.;FREESCALE SEMICONDUCTOR, INC. 发明人 GREEN BRUCE M.;HILL DARRELL G.;HUANG JENN HWA;MOORE KAREN E.
分类号 H01L29/812;H01L21/311;H01L29/778 主分类号 H01L29/812
代理机构 代理人
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