发明名称 試料連続分析装置及び試料連続分析方法
摘要 PROBLEM TO BE SOLVED: To provide a sample analyzer and a sample analysis method in which the laser output is stable and continuous analysis of a sample can be conducted excellently.SOLUTION: A sample analyzer includes: a laser ablation section having a laser oscillation source with an oscillation output of 5 W or more, for irradiating the surface of a sample with a laser beam to make part of the sample into fine particles; and an element detection section to which the sample made into fine particles is introduced and a constituent element included in the sample is detected.
申请公布号 JP5944936(B2) 申请公布日期 2016.07.05
申请号 JP20140023656 申请日期 2014.02.10
申请人 JX金属株式会社 发明人 上村 憲一
分类号 G01N1/28;G01N21/73;G01N27/62 主分类号 G01N1/28
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