发明名称 |
System for monitoring failure of substrate processing apparatus, and method for monitoring failure of substrate processing apparatus |
摘要 |
Disclosed is a failure monitoring system for monitoring a failure of a substrate processing apparatus that performs a predetermined processing on a substrate to be processed, the failure monitoring system including: an alarm collecting unit configured to collects alarms issued from the substrate processing apparatus; and an analyzing unit configured to analyze the alarms collected by the alarm collecting unit and display, as an image, an alarm issuing frequency in each monitoring period on a two-dimensional space, of which one axis represents an alarm ID that specifies an alarm issuing area and another axis represents a predetermined monitor period. |
申请公布号 |
US9412256(B2) |
申请公布日期 |
2016.08.09 |
申请号 |
US201314387668 |
申请日期 |
2013.03.14 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
Namioka Ichiro |
分类号 |
G08B21/00;G08B21/18;H01L21/67 |
主分类号 |
G08B21/00 |
代理机构 |
Rothwell, Figg, Ernst & Manbeck, P.C. |
代理人 |
Rothwell, Figg, Ernst & Manbeck, P.C. |
主权项 |
1. A failure monitoring system for monitoring a failure of a substrate processing apparatus that performs a predetermined processing on a substrate to be processed, the failure monitoring system comprising:
an alarm collecting unit configured to collect alarms issued from the substrate processing apparatus; and an analyzing unit configured to analyze the alarms collected by the alarm collecting unit and display, as an image, an alarm issuing frequency in each monitoring period on a two-dimensional space, of which one axis represents an alarm ID that specifies an alarm issuing area and another axis represents a predetermined monitor period thereby enabling a user to visually monitor both an alarm issuing tendency of the failure of the substrate processing apparatus for each of the predetermined monitor period and an inter-alarm tendency of the failure of the substrate processing apparatus within the predetermined monitor period. |
地址 |
Tokyo JP |