发明名称 METHOD AND SYSTEM FOR TESTING JITTER COMPATIBILITY
摘要 <p>A method and system for testing jitter compatibility are disclosed in the present invention, which includes: an interconnection testing board configured with a non-NRZ optical transponder needing to satisfy the board jitter performance specification, and according to the specification, testing the jitter performance of the interconnection testing board to indirectly judge whether the jitter compatibility of non-NRZ optical transponder at a line side of the interconnection testing board is qualified, wherein: at the line side and a client side of the interconnection testing board, a non-NRZ optical transponder to be tested and an NRZ optical transponder with qualified jitter performance are configured respectively, and the jitter performance of interconnection testing board is tested; according to a principle that a non-NRZ optical transponder with qualified jitter performance should not cause a jitter performance of the board to which the non-NRZ optical transponder with qualified jitter performance belongs to be unqualified, if the qualified jitter performance of interconnection testing board is obtained through testing, believing that the jitter compatibility of non-NRZ optical transponder to be tested is qualified.</p>
申请公布号 EP2584717(A4) 申请公布日期 2013.12.25
申请号 EP20100854649 申请日期 2010.12.28
申请人 ZTE CORPORATION 发明人 LI, MENG
分类号 H04B10/079 主分类号 H04B10/079
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