发明名称 Method for performing pattern decomposition based on feature pitch
摘要 The present invention discloses a method for decomposing a target pattern containing features to be printed on a wafer, into multiple patterns, the features having a plurality of patterns within a minimum pitch for processes utilized to image the target pattern. The method includes superposing a predefined kernel over a pixel, and moving the kernel from one pixel to another, the pixels representing the sub-patterns of the target pattern. Polarity of the kernel may be reversed when the pixel has a stored intensity value that is negative.
申请公布号 US8615126(B2) 申请公布日期 2013.12.24
申请号 US201113170126 申请日期 2011.06.27
申请人 PARK JUNG CHUL;ASML MASKTOOLS B.V. 发明人 PARK JUNG CHUL
分类号 G06K9/00 主分类号 G06K9/00
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