发明名称 |
Semiconductor memory device having a redundancy area |
摘要 |
Provided is a semiconductor memory device. The semiconductor memory includes a main area and a redundancy area. The main area includes a plurality of memory blocks sharing a write bit line and a read bit line. The redundancy area includes a plurality of redundancy memory blocks sharing a redundancy write bit line and a redundancy read bit line. The redundancy area is provided to replace a component in the main area having a defect. |
申请公布号 |
US8614925(B2) |
申请公布日期 |
2013.12.24 |
申请号 |
US20100814776 |
申请日期 |
2010.06.14 |
申请人 |
PARK JOONMIN;CHO BEAKHYUNG;LEE KWANGJIN;KIM HYE-JIN;SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK JOONMIN;CHO BEAKHYUNG;LEE KWANGJIN;KIM HYE-JIN |
分类号 |
G11C7/00 |
主分类号 |
G11C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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