发明名称 Microlithography projection system with an accessible diaphragm or aperture stop
摘要 The invention relates to a microlithography projection lens for wavelengths <=248 nm <=, preferably <=193 mm, in particular EUV lithography for wavelengths ranging from 1-30 nm for imaging an object field in an object plane onto an image field in an image plane, the microlithography projection lens developed in such a manner that provision is made for an accessible diaphragm plane, into which for instance an iris diaphragm can be introduced.
申请公布号 US8614785(B2) 申请公布日期 2013.12.24
申请号 US201113173560 申请日期 2011.06.30
申请人 MANN HANS-JUERGEN;CARL ZEISS SMT GMBH 发明人 MANN HANS-JUERGEN
分类号 G03B27/70;G02B17/06;G02B27/18;G03F7/20 主分类号 G03B27/70
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