发明名称 Current leakage reduction
摘要 This description relates to a circuit including a bit line. The circuit further includes at least one memory bank. The at least one memory bank includes at least one memory cell, a first device configured to provide a current path between the bit line and the at least one memory cell when the at least one memory cell is activated, and a second device configured to reduce current leakage between the bit line and the at least one memory cell when the at least one memory cell is deactivated. The circuit further includes a tracking device configured to receive a mirror current substantially equal to a current along the current path, the tracking device configured to have a resistance substantially equal to a cumulative resistance of all memory cells of the at least one memory cell.
申请公布号 US8614927(B2) 申请公布日期 2013.12.24
申请号 US201213595551 申请日期 2012.08.27
申请人 LIN SUNG-CHIEH;HSU KUOYUAN (PETER);HUANG JIANN-TSENG;LIAO WEI-LI;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN SUNG-CHIEH;HSU KUOYUAN (PETER);HUANG JIANN-TSENG;LIAO WEI-LI
分类号 G11C7/00 主分类号 G11C7/00
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