发明名称 PLASMA PROCESSING APPARATUS WITH REDUCED EFFECTS OF PROCESS CHAMBER ASYMMETRY
摘要 Plasma processing apparatus that provide an asymmetric plasma distribution within the processing apparatus are provided herein. In some embodiments, a plasma processing apparatus may include a process chamber having a processing volume with a substrate support disposed therein; and a first RF coil disposed above the substrate support to couple RF energy into the processing volume, wherein an electric field generated by RF energy moving along the first RF coil is asymmetric about a central axis of the substrate support. In some embodiments, a pump port is disposed asymmetrically with respect to the processing volume to remove one or more gases from the processing volume. In some embodiments, the first RF coil is asymmetrically disposed about the central axis of the substrate support.
申请公布号 KR20130140035(A) 申请公布日期 2013.12.23
申请号 KR20137013348 申请日期 2011.10.25
申请人 APPLIED MATERIALS, INC. 发明人 CHEBI ROBERT;CHESHIRE ALAN;DETMAR STANLEY;ROUPILLARD GABRIEL
分类号 H05H1/46;H01L21/205;H01L21/3065 主分类号 H05H1/46
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