发明名称 SELF-ALIGNED CONTACTS
摘要 A transistor comprises a substrate, a pair of spacers on the substrate, a gate dielectric layer on the substrate and between the pair of spacers, a gate electrode layer on the gate dielectric layer and between the pair of spacers, an insulating cap layer on the gate electrode layer and between the pair of spacers, and a pair of diffusion regions adjacent to the pair of spacers. The insulating cap layer forms an etch stop structure that is self aligned to the gate and prevents the contact etch from exposing the gate electrode, thereby preventing a short between the gate and contact. The insulator-cap layer enables self-aligned contacts, allowing initial patterning of wider contacts that are more robust to patterning limitations.
申请公布号 KR20130140231(A) 申请公布日期 2013.12.23
申请号 KR20137033304 申请日期 2010.12.07
申请人 INTEL CORPORATION 发明人 BOHR MARK T.;GHANI TAHIR;RAHHAL ORABI NADIA M.;JOSHI SUBHASH;STEIGERWALD JOSEPH M.;KLAUS JASON W.;HWANG JACK;MACKIEWICZ RYAN
分类号 H01L29/78;H01L21/28;H01L21/3205;H01L21/336 主分类号 H01L29/78
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