发明名称
摘要 <p>Structures and methods are provided for performing non-destructive and secure disablement of integrated circuit (IC) functionality. A structure for enabling non-destructive and secure disablement and re-enablement of the IC includes a micro-electrical mechanical structure (MEMS) initially set to a chip enable state. The structure also includes an activation circuit operable to set the MEMS device to an error state based on a detected predetermined condition of the IC. The IC is disabled when the MEMS device is in the error state.</p>
申请公布号 JP2013545206(A) 申请公布日期 2013.12.19
申请号 JP20130543184 申请日期 2011.11.18
申请人 发明人
分类号 G06F21/60 主分类号 G06F21/60
代理机构 代理人
主权项
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