摘要 |
<p>An operation analysis method for an integrated circuit is provided with: a step for operating a circuit element in a predetermined clock cycle and inputting a signal waveform to the circuit element; a step for detecting a light emission position and a light emission amount during a period including the rising edge of a clock waveform, and a light emission position and a light emission amount during a period including the falling edge of the clock waveform over a plurality of cycles; and a step for generating at least one of data obtained by adding up detection data during a period when the signal waveform maintains a first state, data obtained by adding up detection data during a period when the signal waveform makes a transition from the first state to a second state, data obtained by adding up detection data during a period when the signal waveform maintains the second state, and data obtained by adding up detection data during a period when the signal waveform makes a transition from the second state to the first state, among a plurality of pieces of detection data.</p> |