发明名称 OPERATION ANALYSIS METHOD FOR INTEGRATED CIRCUIT, AND OPERATION ANALYSIS DEVICE FOR INTEGRATED CIRCUIT
摘要 <p>An operation analysis method for an integrated circuit is provided with: a step for operating a circuit element in a predetermined clock cycle and inputting a signal waveform to the circuit element; a step for detecting a light emission position and a light emission amount during a period including the rising edge of a clock waveform, and a light emission position and a light emission amount during a period including the falling edge of the clock waveform over a plurality of cycles; and a step for generating at least one of data obtained by adding up detection data during a period when the signal waveform maintains a first state, data obtained by adding up detection data during a period when the signal waveform makes a transition from the first state to a second state, data obtained by adding up detection data during a period when the signal waveform maintains the second state, and data obtained by adding up detection data during a period when the signal waveform makes a transition from the second state to the first state, among a plurality of pieces of detection data.</p>
申请公布号 WO2013187200(A1) 申请公布日期 2013.12.19
申请号 WO2013JP64264 申请日期 2013.05.22
申请人 HAMAMATSU PHOTONICS K.K. 发明人 NAKAMURA TOMONORI
分类号 G01R31/302;H01L21/66 主分类号 G01R31/302
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