TEST APPARATUS, TEST SYSTEM, METHOD, AND CARRIER FOR TESTING ELECTRONIC COMPONENT UNDER TRANSFORMATION CONDITION

摘要

PROBLEM TO BE SOLVED: To provide a test apparatus capable of providing reliable tests of electronic components under a transformation condition, reducing test cost of the electronic components under the transformation condition and achieving flexible application to different test requirements.SOLUTION: A test apparatus, a test system, a method, and a carrier for testing electronic components under a transformation condition include: a first chamber half body and a second chamber half body; a first gasket and a second gasket; a carrier segment configured to support a plurality of electronic components; and a circular carrier section surrounding the carrier segment. The circular carrier section includes a first side and a second side. The first gasket is arranged between the first chamber half body and the first side of the circular carrier section to form an airtight seal, and the second gasket is arranged between the second chamber half body and the second side of the circular carrier section to form an airtight seal.