发明名称 MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To enable an average value to be acquired in a short time and reduce manufacturing cost.SOLUTION: When acquiring an average value of La (2≤La=Na-Ma-Mb) measured values except the measured values of Ma (2≤Ma≤Na-4) small values and the measured values of Mb (2≤Mb≤Na-4) large values of Na (6≤Na) values: a first measured value is stored in regions 6a, 6b, 6d (steps 12 to 14); a total sum in the region 6a, a first total value in the region 6b, and a measured value in the region 6d are updated according to a Ka-th (2≤Ka≤Ma) measured value (A-processing 10A); the total sum, the first total value, a second total value in the region 6c, and measured values in the regions 6d, 6e are updated according to measured values from Kb-th (Kb=Ma+1) to Kd-th (Ma+Mb+1≤Kd≤Na) measured values (B-processing 10B, C-processing 10C, processing 10D); and thereafter, an average value is acquired by dividing a value obtained by subtracting the first total value and the second total value from the total sum by La (step 15).
申请公布号 JP2013253860(A) 申请公布日期 2013.12.19
申请号 JP20120129565 申请日期 2012.06.07
申请人 HIOKI EE CORP 发明人 IIJIMA TADASHI
分类号 G01R27/02 主分类号 G01R27/02
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