发明名称 X-RAY INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspection device that accurately inspects an object in which area values or volume values of content are different by row due to a conveyance position of the content.SOLUTION: An X-ray inspection device 1 includes: an image processing part 43 that applies the same image processing algorithm for rows of the content of an object, to an X-ray image output by an X-ray detector 10, for image processing; and a determination part 44 that determines a shape quality of the object W by use of quality determination threshold (an upper limit value and a lower limit value) set for each of the rows of content, with respect to the X-ray image image-processed by the image processing part 43.
申请公布号 JP2013253832(A) 申请公布日期 2013.12.19
申请号 JP20120128867 申请日期 2012.06.06
申请人 ANRITSU SANKI SYSTEM CO LTD 发明人 KANAI TAKASHI;MIYAZAKI ITARU;MORIYA JUNICHI
分类号 G01N23/04 主分类号 G01N23/04
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